Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope.
نویسندگان
چکیده
An optical configuration is presented for simultaneous measurement of out-of-plane displacement and slope change in electronic speckle pattern interferometry. Experimental results for a rectangular plate clamped along the edges and loaded at the center are presented.
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ورودعنوان ژورنال:
- Optics letters
دوره 18 21 شماره
صفحات -
تاریخ انتشار 1993